Mauro Annarumma, Giovanni Montana. Deep metric learning for multi-labelled radiographs. In Hisham M. Haddad, Roger L. Wainwright, Richard Chbeir, editors, Proceedings of the 33rd Annual ACM Symposium on Applied Computing, SAC 2018, Pau, France, April 09-13, 2018. pages 34-37, ACM, 2018. [doi]
Abstract is missing.