A novel gate grading approach for soft error tolerance in combinational circuits - researchr publication authors

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Mohammad Saeed Ansari, Ali Mahani, Jie Han, Bruce F. Cockburn. A novel gate grading approach for soft error tolerance in combinational circuits. In 2016 IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2016, Vancouver, BC, Canada, May 15-18, 2016. pages 1-4, IEEE, 2016. [doi]

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