Mohammad Saeed Ansari, Ali Mahani, Jie Han, Bruce F. Cockburn. A novel gate grading approach for soft error tolerance in combinational circuits. In 2016 IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2016, Vancouver, BC, Canada, May 15-18, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{AnsariMHC16,
title = {A novel gate grading approach for soft error tolerance in combinational circuits},
author = {Mohammad Saeed Ansari and Ali Mahani and Jie Han and Bruce F. Cockburn},
year = {2016},
doi = {10.1109/CCECE.2016.7726658},
url = {http://dx.doi.org/10.1109/CCECE.2016.7726658},
researchr = {https://researchr.org/publication/AnsariMHC16},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2016 IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2016, Vancouver, BC, Canada, May 15-18, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8721-7},
}