Electrical Characterization of Megabit DRAMs, Part 1: External Testing

G. Antonin, H.-D. Oberle, Jochen Kolzer. Electrical Characterization of Megabit DRAMs, Part 1: External Testing. IEEE Design & Test of Computers, 8(3):36-43, 1991. [doi]

Authors

G. Antonin

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H.-D. Oberle

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Jochen Kolzer

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