Effects of Electrostatic Charge Accumulation During MEMS Fabrication

Angela Antoniu, Mark Salomons, Nicolae Reus. Effects of Electrostatic Charge Accumulation During MEMS Fabrication. In 2003 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2003), 20-23 July 2003, Banff, Alberta, Canada. pages 69-75, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.