Artem V. Antonyuk, Vladimir Ya. Stenin. The Fault Tolerant CMOS Logical Element of Matching for a Content-Addressable Memory. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-4, IEEE, 2018. [doi]
@inproceedings{AntonyukS18, title = {The Fault Tolerant CMOS Logical Element of Matching for a Content-Addressable Memory}, author = {Artem V. Antonyuk and Vladimir Ya. Stenin}, year = {2018}, doi = {10.1109/EWDTS.2018.8524634}, url = {https://doi.org/10.1109/EWDTS.2018.8524634}, researchr = {https://researchr.org/publication/AntonyukS18}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018}, publisher = {IEEE}, isbn = {978-1-5386-5710-2}, }