The Fault Tolerant CMOS Logical Element of Matching for a Content-Addressable Memory - researchr publication

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Artem V. Antonyuk, Vladimir Ya. Stenin. The Fault Tolerant CMOS Logical Element of Matching for a Content-Addressable Memory. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-4, IEEE, 2018. [doi]

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