Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi 0001. Evaluation of Null Method for Operational Amplifier Short-Time Testing. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{AokiSIOIKSMNWKH19,
title = {Evaluation of Null Method for Operational Amplifier Short-Time Testing},
author = {Riho Aoki and Keno Sato and Takashi Ishida and Toshiyuki Okamoto and Tamotsu Ichikawa and Shogo Katayama and Yuto Sasaki and Kosuke Machida and Takayuki Nakatani and Jianlong Wang and Anna Kuwana and Kazumi Hatayama and Haruo Kobayashi 0001},
year = {2019},
doi = {10.1109/ASICON47005.2019.8983452},
url = {https://doi.org/10.1109/ASICON47005.2019.8983452},
researchr = {https://researchr.org/publication/AokiSIOIKSMNWKH19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0735-6},
}