Hitoshi Aoki, Hiroyuki Sakairi, Naotaka Kuroda, Kentaro Chikamatsu, Ken Nakahara. Switching Time Characterization and Modeling of AlN/GaN MIS-HEMTs. In IEEE International Conference on Industrial Technology, ICIT 2019, Melbourne, Australia, February 13-15, 2019. pages 550-555, IEEE, 2019. [doi]
@inproceedings{AokiSKCN19,
title = {Switching Time Characterization and Modeling of AlN/GaN MIS-HEMTs},
author = {Hitoshi Aoki and Hiroyuki Sakairi and Naotaka Kuroda and Kentaro Chikamatsu and Ken Nakahara},
year = {2019},
doi = {10.1109/ICIT.2019.8755031},
url = {https://doi.org/10.1109/ICIT.2019.8755031},
researchr = {https://researchr.org/publication/AokiSKCN19},
cites = {0},
citedby = {0},
pages = {550-555},
booktitle = {IEEE International Conference on Industrial Technology, ICIT 2019, Melbourne, Australia, February 13-15, 2019},
publisher = {IEEE},
isbn = {978-1-5386-6376-9},
}