Extended Abstract: Deep Learning of the Physical Layer for BICM Systems

Fayçal Ait Aoudia, Sebastian Cammerer, Sebastian Dörner, Maximilian Stark, Jakob Hoydis, Stephan ten Brink. Extended Abstract: Deep Learning of the Physical Layer for BICM Systems. In IEEE Workshop on Signal Processing Systems, SiPS 2020, Coimbra, Portugal, October 20-22, 2020. pages 1, IEEE, 2020. [doi]

Abstract

Abstract is missing.