A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution

Sadok Aouini, Jean-Francois Bousquet, Naim Ben Hamida, Lukas Jakober, John Wolczanski, Christopher Kurowski. A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]

Authors

Sadok Aouini

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Jean-Francois Bousquet

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Naim Ben Hamida

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Lukas Jakober

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John Wolczanski

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Christopher Kurowski

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