A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution

Sadok Aouini, Jean-Francois Bousquet, Naim Ben Hamida, Lukas Jakober, John Wolczanski, Christopher Kurowski. A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]

@inproceedings{AouiniBBJWK13,
  title = {A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution},
  author = {Sadok Aouini and Jean-Francois Bousquet and Naim Ben Hamida and Lukas Jakober and John Wolczanski and Christopher Kurowski},
  year = {2013},
  doi = {10.1109/CICC.2013.6658543},
  url = {http://dx.doi.org/10.1109/CICC.2013.6658543},
  researchr = {https://researchr.org/publication/AouiniBBJWK13},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013},
  publisher = {IEEE},
}