Metrological foundations of emotional valence measurement through an EEG-based system

Andrea Apicella 0001, Pasquale Arpaia, Antonio Esposito 0002, Giovanna Mastrati, Nicola Moccaldi. Metrological foundations of emotional valence measurement through an EEG-based system. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-6, IEEE, 2022. [doi]

Authors

Andrea Apicella 0001

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Pasquale Arpaia

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Antonio Esposito 0002

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Giovanna Mastrati

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Nicola Moccaldi

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