Davide Appello. The Yield of Test Outsourcing. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1215, IEEE Computer Society, 2002. [doi]
@inproceedings{Appello02,
title = {The Yield of Test Outsourcing},
author = {Davide Appello},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431215.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/Appello02},
cites = {0},
citedby = {0},
pages = {1215},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}