Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante. Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 379-385, IEEE Computer Society, 2003. [doi]
Abstract is missing.