Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo. Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions, 91-D(3):726-735, 2008. [doi]
Abstract is missing.