Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková. Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 71-74, IEEE, 2011. [doi]
@inproceedings{ArbetBGS11,
title = {Increasing the efficiency of analog OBIST using on-chip compensation of technology variations},
author = {Daniel Arbet and Juraj Brenkus and Gábor Gyepes and Viera Stopjaková},
year = {2011},
doi = {10.1109/DDECS.2011.5783050},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783050},
researchr = {https://researchr.org/publication/ArbetBGS11},
cites = {0},
citedby = {0},
pages = {71-74},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}