Daniel Arbet, Juraj Brenkus, Gábor Gyepes, Viera Stopjaková. Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 71-74, IEEE, 2011. [doi]
Abstract is missing.