Edoardo Ardizzone, Sebastiano Battiato, Alessandro Capra, Salvatore Curti. Real metrology by using depth map information. In Brian D. Corner, Peng Li, Roy P. Pargas, editors, Proceedings of the Conference on Three-Dimensional Image Capture and Applications VI, San Jose, CA, USA, January 18, 2004. Volume 5302 of SPIE Proceedings, pages 87-94, SPIE, 2004. [doi]
Abstract is missing.