C-0.57 eV trap in GaN

A. R. Arehart, A. Sasikumar, G. D. Via, B. S. Poling, E. R. Heller, S. A. Ringel. C-0.57 eV trap in GaN. Microelectronics Reliability, 56:45-48, 2016. [doi]

Abstract

Abstract is missing.