Francisco Arellano-Espitia, Artvin Darien Gonzalez-Abreu, Miguel Delgado Prieto, Juan José Saucedo-Dorantes, Roque Alfredo Osornio-Rios. Analysis of Machine Learning based Condition Monitoring Schemes Applied to Complex Electromechanical Systems. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 1419-1422, IEEE, 2020. [doi]
@inproceedings{Arellano-Espitia20-0,
title = {Analysis of Machine Learning based Condition Monitoring Schemes Applied to Complex Electromechanical Systems},
author = {Francisco Arellano-Espitia and Artvin Darien Gonzalez-Abreu and Miguel Delgado Prieto and Juan José Saucedo-Dorantes and Roque Alfredo Osornio-Rios},
year = {2020},
doi = {10.1109/ETFA46521.2020.9212026},
url = {https://doi.org/10.1109/ETFA46521.2020.9212026},
researchr = {https://researchr.org/publication/Arellano-Espitia20-0},
cites = {0},
citedby = {0},
pages = {1419-1422},
booktitle = {25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8956-7},
}