Francisco Arellano-Espitia, Artvin Darien Gonzalez-Abreu, Miguel Delgado Prieto, Juan José Saucedo-Dorantes, Roque Alfredo Osornio-Rios. Analysis of Machine Learning based Condition Monitoring Schemes Applied to Complex Electromechanical Systems. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 1419-1422, IEEE, 2020. [doi]
Abstract is missing.