Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin. NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. Microelectronics Reliability, 48(8-9):1310-1312, 2008. [doi]
@article{AresuPGG08,
title = {NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique},
author = {Stefano Aresu and Reinhard Pufall and Michael Goroll and Wolfgang Gustin},
year = {2008},
doi = {10.1016/j.microrel.2008.07.015},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.015},
tags = {analysis},
researchr = {https://researchr.org/publication/AresuPGG08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1310-1312},
}