Noureddine Aribi, Nadjib Lazaar, Yahia Lebbah, Samir Loudni, Mehdi Maamar. A Multiple Fault Localization Approach Based on Multicriteria Analytical Hierarchy Process. In IEEE International Conference On Artificial Intelligence Testing, AITest 2019, Newark, CA, USA, April 4-9, 2019. pages 1-8, IEEE, 2019. [doi]
Abstract is missing.