Physical and conceptual identifier dispersion: Measures and relation to fault proneness

Venera Arnaoudova, Laleh Mousavi Eshkevari, Rocco Oliveto, Yann-Gaël Guéhéneuc, Giuliano Antoniol. Physical and conceptual identifier dispersion: Measures and relation to fault proneness. In 26th IEEE International Conference on Software Maintenance (ICSM 2010), September 12-18, 2010, Timisoara, Romania. pages 1-5, IEEE Computer Society, 2010. [doi]

Abstract

Abstract is missing.