Mohamad Arnaout, Ahmad Ghizzawi, Ali Al-Hajj Hassan, Ali Koubayssi, Moussa Kafal, Ziad Noun. The Detection and Classification of Faults by the Use of Machine Learning Technique. In International Conference on Microelectronics, ICM 2021, New Cairo City, Egypt, December 19-22, 2021. pages 242-245, IEEE, 2021. [doi]
Abstract is missing.