Vikram Arora, Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das. A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays. IEEE T. Instrumentation and Measurement, 53(4):915-932, 2004. [doi]
@article{AroraJHD04, title = {A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays}, author = {Vikram Arora and Wen-Ben Jone and Der-Cheng Huang and Sunil R. Das}, year = {2004}, doi = {10.1109/TIM.2004.830785}, url = {http://dx.doi.org/10.1109/TIM.2004.830785}, tags = {diagnostics}, researchr = {https://researchr.org/publication/AroraJHD04}, cites = {0}, citedby = {0}, journal = {IEEE T. Instrumentation and Measurement}, volume = {53}, number = {4}, pages = {915-932}, }