Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements - researchr publication authors

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Pasquale Arpaia, Carlo Baccigalupi, Michele Martino. Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements. In 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015. pages 1532-1536, IEEE, 2015. [doi]

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