Pasquale Arpaia, Carlo Baccigalupi, Michele Martino. Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements. In 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015. pages 1532-1536, IEEE, 2015. [doi]
@inproceedings{ArpaiaBM15,
title = {Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements},
author = {Pasquale Arpaia and Carlo Baccigalupi and Michele Martino},
year = {2015},
doi = {10.1109/I2MTC.2015.7151506},
url = {https://doi.org/10.1109/I2MTC.2015.7151506},
researchr = {https://researchr.org/publication/ArpaiaBM15},
cites = {0},
citedby = {0},
pages = {1532-1536},
booktitle = {2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6114-6},
}