Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications

Pasquale Arpaia, Luca Callegaro, Alessandro Cultrera, Antonio Esposito 0002, Massimo Ortolano. Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications. In IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2021, Rome, Italy, June 7-9, 2021. pages 1-5, IEEE, 2021. [doi]

Abstract

Abstract is missing.