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Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures

Engin Arslan, Serkan Bütün, Yasemin Safak, Habibe Uslu, Ilke Tasçioglu, Semsettin Altindal, Ekmel Özbay. Electrical characterization of MS and MIS structures on AlGaN/AlN/GaN heterostructures. Microelectronics Reliability, 51(2):370-375, 2011. [doi]

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Engin Arslan

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Serkan Bütün

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Yasemin Safak

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Habibe Uslu

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Ilke Tasçioglu

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Semsettin Altindal

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Ekmel Özbay

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