Baris Arslan, Alex Orailoglu. CircularScan: A Scan Architecture for Test Cost Reduction. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 1290-1295, IEEE Computer Society, 2004. [doi]
@inproceedings{ArslanO04:0,
title = {CircularScan: A Scan Architecture for Test Cost Reduction},
author = {Baris Arslan and Alex Orailoglu},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/date/2004/2085/02/208521290abs.htm},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/ArslanO04%3A0},
cites = {0},
citedby = {0},
pages = {1290-1295},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2085-5},
}