Design space exploration for aggressive test cost reduction in CircularScan architectures

Baris Arslan, Alex Orailoglu. Design space exploration for aggressive test cost reduction in CircularScan architectures. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 726-731, IEEE Computer Society / ACM, 2004. [doi]

Authors

Baris Arslan

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Alex Orailoglu

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