Baris Arslan, Alex Orailoglu. Design space exploration for aggressive test cost reduction in CircularScan architectures. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 726-731, IEEE Computer Society / ACM, 2004. [doi]
@inproceedings{ArslanO04:1,
title = {Design space exploration for aggressive test cost reduction in CircularScan architectures},
author = {Baris Arslan and Alex Orailoglu},
year = {2004},
doi = {10.1145/1112239.1112353},
url = {http://doi.acm.org/10.1145/1112239.1112353},
tags = {architecture, testing, design},
researchr = {https://researchr.org/publication/ArslanO04%3A1},
cites = {0},
citedby = {0},
pages = {726-731},
booktitle = {2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society / ACM},
isbn = {0-7803-8702-3},
}