BIST architecture to detect defects in tsvs during pre-bond testing

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras. BIST architecture to detect defects in tsvs during pre-bond testing. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1, IEEE Computer Society, 2013. [doi]

Authors

Daniel Arumí

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Rosa Rodríguez-Montañés

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Joan Figueras

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