Randomized Polynomial-Time Identity Testing for Noncommutative Circuits - researchr publication authors

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Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja 0001. Randomized Polynomial-Time Identity Testing for Noncommutative Circuits. Theory of Computing, 15:1-36, 2019. [doi]

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