Randomized Polynomial-Time Identity Testing for Noncommutative Circuits

Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja 0001. Randomized Polynomial-Time Identity Testing for Noncommutative Circuits. Theory of Computing, 15:1-36, 2019. [doi]

@article{ArvindJM019,
  title = {Randomized Polynomial-Time Identity Testing for Noncommutative Circuits},
  author = {Vikraman Arvind and Pushkar S. Joglekar and Partha Mukhopadhyay and S. Raja 0001},
  year = {2019},
  doi = {10.4086/toc.2019.v015a007},
  url = {https://doi.org/10.4086/toc.2019.v015a007},
  researchr = {https://researchr.org/publication/ArvindJM019},
  cites = {0},
  citedby = {0},
  journal = {Theory of Computing},
  volume = {15},
  pages = {1-36},
}