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In situ measurement of aging-induced performance degradation in digital circuits

Nasim Pour Aryan, Christian Funke, Jens Barsfrede, Cenk Yilniaz, Doris Schmitt-Landsiedel, Georg Georsakos. In situ measurement of aging-induced performance degradation in digital circuits. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-2, IEEE, 2016. [doi]

Authors

Nasim Pour Aryan

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Christian Funke

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Jens Barsfrede

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Cenk Yilniaz

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Doris Schmitt-Landsiedel

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Georg Georsakos

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