Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model

Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama. Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model. In ICCV. pages 150-155, 1995. [doi]

Authors

Naoki Asada

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Hisanaga Fujiwara

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Takashi Matsuyama

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