Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model

Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama. Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model. In ICCV. pages 150-155, 1995. [doi]

Abstract

Abstract is missing.