Measurement of power supply noise tolerance of self-timed processor

Kunihiro Asada, Taku Sogabe, Toru Nakura, Makoto Ikeda. Measurement of power supply noise tolerance of self-timed processor. In Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic. pages 128-131, IEEE Computer Society, 2009. [doi]

@inproceedings{AsadaSNI09,
  title = {Measurement of power supply noise tolerance of self-timed processor},
  author = {Kunihiro Asada and Taku Sogabe and Toru Nakura and Makoto Ikeda},
  year = {2009},
  doi = {10.1109/DDECS.2009.5012112},
  url = {http://dx.doi.org/10.1109/DDECS.2009.5012112},
  researchr = {https://researchr.org/publication/AsadaSNI09},
  cites = {0},
  citedby = {0},
  pages = {128-131},
  booktitle = {Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic},
  publisher = {IEEE Computer Society},
}