Akira Asano, Tohru Yamashita, Shunsuk Yokozeki. Active contour model based on mathematical morphology. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 1455-1457, IEEE, 1998. [doi]
Abstract is missing.