Relating Expectations to Automatically Recovered Design Patterns

Angel Asencio, Sam Cardman, David Harris, Ellen Laderman. Relating Expectations to Automatically Recovered Design Patterns. In Arie van Deursen, Elizabeth Burd, editors, 9th Working Conference on Reverse Engineering (WCRE 2002), 28 October - 1 November 2002, Richmond, VA, USA. pages 87-96, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.