Asen Asenov. Statistical Device Variability and its Impact on Yield and Performance. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 253, IEEE Computer Society, 2007. [doi]
@inproceedings{Asenov07,
title = {Statistical Device Variability and its Impact on Yield and Performance},
author = {Asen Asenov},
year = {2007},
doi = {10.1109/IOLTS.2007.64},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.64},
researchr = {https://researchr.org/publication/Asenov07},
cites = {0},
citedby = {0},
pages = {253},
booktitle = {13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece},
publisher = {IEEE Computer Society},
}