Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou. Special section reliability and variability of devices for circuits and systems. Microelectronics Reliability, 54(6-7):1057, 2014. [doi]
@article{AsenovSTWZ14,
title = {Special section reliability and variability of devices for circuits and systems},
author = {Asen Asenov and Ulf Schlichtmann and Cher Ming Tan and Hei Wong and Xing Zhou},
year = {2014},
doi = {10.1016/j.microrel.2014.03.010},
url = {http://dx.doi.org/10.1016/j.microrel.2014.03.010},
researchr = {https://researchr.org/publication/AsenovSTWZ14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {6-7},
pages = {1057},
}