GLCM-based chi-square histogram distance for automatic detection of defects on patterned textures

V. Asha, Nagappa U. Bhajantri, P. Nagabhushan. GLCM-based chi-square histogram distance for automatic detection of defects on patterned textures. IJCVR, 2(4):302-313, 2011. [doi]

Abstract

Abstract is missing.