The following publications are possibly variants of this publication:
- Automatic Detection of Defects on Periodically Patterned TexturesV. Asha, Nagappa U. Bhajantri, P. Nagabhushan. jois, 20(3):279-303, 2011. [doi]
- GLCM-based chi-square histogram distance for automatic detection of defects on patterned texturesV. Asha, Nagappa U. Bhajantri, P. Nagabhushan. ijcvr, 2(4):302-313, 2011. [doi]
- Automatic Detection of Texture-defects using Texture-periodicity and Jensen-Shannon DivergenceV. Asha, Nagappa U. Bhajantri, P. Nagabhushan. jips, 8(2):359-374, 2012. [doi]