D. G. Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi. Testing of programmable logic devices (PLD) with faulty resources. In 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France. pages 76-84, IEEE Computer Society, 1997. [doi]
@inproceedings{AshenMPL97,
title = {Testing of programmable logic devices (PLD) with faulty resources},
author = {D. G. Ashen and Fred J. Meyer and Nohpill Park and Fabrizio Lombardi},
year = {1997},
url = {http://computer.org/proceedings/dft/8168/81680076abs.htm},
tags = {testing, logic programming, logic},
researchr = {https://researchr.org/publication/AshenMPL97},
cites = {0},
citedby = {0},
pages = {76-84},
booktitle = {1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT 97), 20-22 October 1997, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-8186-8168-3},
}