Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations - researchr publication authors

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Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit Chatterjee, Adit D. Singh, Abdulkadir Utku Diril. Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 711-716, IEEE Computer Society, 2007. [doi]

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