Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda. A BIST Solution for Frequency Domain Characterization of Analog Circuits. J. Electronic Testing, 26(4):429-441, 2010. [doi]
@article{AsianVR10,
title = {A BIST Solution for Frequency Domain Characterization of Analog Circuits},
author = {Manuel J. Barragan Asian and Diego Vázquez and Adoración Rueda},
year = {2010},
doi = {10.1007/s10836-010-5158-7},
url = {http://dx.doi.org/10.1007/s10836-010-5158-7},
researchr = {https://researchr.org/publication/AsianVR10},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {26},
number = {4},
pages = {429-441},
}